Title :
Modeling electromagnetic interference to computer and information equipment arise from coaxial cable with aperture
Author :
Yinghua, Lu ; Yongning, HUANG ; Xueping, Yu ; Shufangh, LI
Author_Institution :
Beijing Univ. of Posts & Telecommun., China
Abstract :
Electromagnetic wave, such as EMP, HPM and EML, may cause harmful effects or electromagnetic emission security attacks (EMES attacks) on computer and information equipment through connecting cables, especially when the cable has connector or apertures on the shield of the cable. EM wave may penetrate into the cable and propagate into computers and equipment connecting the cable with apertures. Because cables or transmission lines form a very large collector of the externally generated electromagnetic energy, the interference mechanics of the coupling through aperture on the cable sheath is different from the case of coupling through an aperture on the infinitive large conduction plane. The modeling work is made, in which both EM penetration and propagation effects of the EM wave are considered. The transmission effects of the induced current in the cable are also considered.
Keywords :
cable sheathing; coaxial cables; electric connectors; electric current; electromagnetic coupling; electromagnetic induction; electromagnetic interference; electromagnetic pulse; EM penetration; EM wave propagation; EMES attacks; EMI modeling; EML; EMP; HPM; aperture coupling; cable apertures; cable connector; cable sheath; cable shield; coaxial cable; computer equipment; conduction plane; connecting cables; electromagnetic emission security attacks; electromagnetic energy; electromagnetic interference modeling; induced current; information equipment; interference mechanics; transmission effects; transmission lines; Apertures; Coaxial cables; EMP radiation effects; Electromagnetic coupling; Electromagnetic interference; Electromagnetic modeling; Electromagnetic propagation; Electromagnetic scattering; Electromagnetic shielding; Joining processes;
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
DOI :
10.1109/ELMAGC.2002.1177369