DocumentCode :
3146901
Title :
Hierarchical Circuit Extraction with Detailed Parasitic Capacitance
Author :
Tarolli, Gary M. ; Herman, William J.
Author_Institution :
Digital Equipment Corporation, Hudson, MA
fYear :
1983
fDate :
27-29 June 1983
Firstpage :
337
Lastpage :
345
Abstract :
This paper describes a hierarchical MOS layout verification program called IV. IV extracts a circuit netlist from a MOS layout and then compares this netlist to a reference circuit netlist obtained from a schematic. The circuit extraction phase of IV is described in detail. A unique characteristic of the program is the treatment of parasitic capacitance. IV is currently being used in a production environment to extract circuits in a variety of NMOS and CMOS processes.
Keywords :
CMOS process; Data mining; Data structures; Geometry; Integrated circuit interconnections; MOS devices; Parasitic capacitance; Production; Very large scale integration; Voice mail;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1983. 20th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0026-8
Type :
conf
DOI :
10.1109/DAC.1983.1585671
Filename :
1585671
Link To Document :
بازگشت