• DocumentCode
    3147122
  • Title

    Applicability of F-value to Classification Problems with a Numerous Number of Explanatory Variables: Toward Classification Problems in Biometric and Kansei Engineering

  • Author

    Nagashima, Tomomasa ; Wang, Xinping ; Okada, Yoshifumi ; Sawai, Masahiro

  • Author_Institution
    Dept. of Comput. Sci. & Syst. Technol., Muroran Inst. of Technol., Muroran, Japan
  • fYear
    2009
  • fDate
    25-28 June 2009
  • Firstpage
    18
  • Lastpage
    21
  • Abstract
    F-value is a statistics which estimates a significance of variables participating discriminant efficiency. It has been used in statistical discriminant analysis. However, it seems a few investigations on real problems which must cope with a numerous number of explanatory variables amount to tens of thousands. In such cases, it becomes important to extract useful variables for classification from a numerous number of variables, because we do not know in advance which variables make significant contribution.
  • Keywords
    biometrics (access control); data analysis; pattern classification; statistical analysis; F-value; Kansei engineering; biometrics; classification problem; explanatory variables; statistical discriminant analysis; variable significance; Biometrics; Computer science; Feature extraction; Laboratories; Pattern analysis; Pattern recognition; Prediction algorithms; Satellites; Statistics; Testing; F-value; discriminant analysis; explanatory variable; gene expression; power spectrum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics and Kansei Engineering, 2009. ICBAKE 2009. International Conference on
  • Conference_Location
    Cieszyn
  • Print_ISBN
    978-0-7695-3692-7
  • Electronic_ISBN
    978-0-7695-3692-7
  • Type

    conf

  • DOI
    10.1109/ICBAKE.2009.45
  • Filename
    5223283