Title :
SPM study of ferroelectric properties of vinylidene fluoride and trifluoroethylene copolymer
Author :
Takahashi, Yoshiyuki ; Tomoda, Naoko ; Furukawa, Takeo
Author_Institution :
Dept. of Chem., Tokyo Univ. of Sci., Tokyo
Abstract :
Piezoelectric response force microscopy, PFM, is a kind of SPM technique. It measures the change of the position of surface in accordance with the applied voltage, giving local piezoelectric activity. This method is widely applied to ferroelectric ceramics as well as to ferroelectric polymers. We used this method to study the dynamics of polarization reversal in thin films of VDF/TrFE copolymer.
Keywords :
dielectric polarisation; electric domains; ferroelectric ceramics; ferroelectric thin films; piezoelectricity; polymer blends; polymer films; scanning probe microscopy; SPM; copolymer thin films; domain structure; domain wall motion; ferroelectric ceramics; ferroelectric polymers; ferroelectric properties; high spatial resolution; piezoelectric activity; piezoelectric response force microscopy; polarization dynamics; scanning probe microscopy; trifluoroethylene copolymer; vinylidene fluoride; Electrodes; Ferroelectric materials; Gold; Optical polarization; Piezoelectric polarization; Polymer films; Pulse amplifiers; Scanning probe microscopy; Surface topography; Voltage;
Conference_Titel :
Electrets, 2008. ISE-13. 13th International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-1850-3
Electronic_ISBN :
978-1-4244-1851-0
DOI :
10.1109/ISE.2008.4814038
