SPM study of ferroelectric properties of vinylidene fluoride and trifluoroethylene copolymer

Author

Takahashi, Yoshiyuki ; Tomoda, Naoko ; Furukawa, Takeo

Author_Institution

Dept. of Chem., Tokyo Univ. of Sci., Tokyo

fYear

2008

fDate

15-17 Sept. 2008

Abstract

Piezoelectric response force microscopy, PFM, is a kind of SPM technique. It measures the change of the position of surface in accordance with the applied voltage, giving local piezoelectric activity. This method is widely applied to ferroelectric ceramics as well as to ferroelectric polymers. We used this method to study the dynamics of polarization reversal in thin films of VDF/TrFE copolymer.

Keywords

dielectric polarisation; electric domains; ferroelectric ceramics; ferroelectric thin films; piezoelectricity; polymer blends; polymer films; scanning probe microscopy; SPM; copolymer thin films; domain structure; domain wall motion; ferroelectric ceramics; ferroelectric polymers; ferroelectric properties; high spatial resolution; piezoelectric activity; piezoelectric response force microscopy; polarization dynamics; scanning probe microscopy; trifluoroethylene copolymer; vinylidene fluoride; Electrodes; Ferroelectric materials; Gold; Optical polarization; Piezoelectric polarization; Polymer films; Pulse amplifiers; Scanning probe microscopy; Surface topography; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 2008. ISE-13. 13th International Symposium on

Conference_Location

Tokyo

Print_ISBN

978-1-4244-1850-3

Electronic_ISBN

978-1-4244-1851-0

Type

conf

DOI

10.1109/ISE.2008.4814038

Filename

4814038