Title :
Outliers in Biometrical Data - Two Real Examples of Analysis
Author :
Bartkowiak, Anna
Author_Institution :
Inst. of Comput. Sci., Univ. of Wroclaw, Wroclaw, Poland
Abstract :
The problem of finding and identifying outliers in multivariate measurement data is as old as the data analysis itself. The question: "what is an outlier" has many answers, is is especially difficult when considering high-dimensional data. In the paper a search for outliers in two real data sets is shown. It is stressed that identifying outliers should not be done on the basis of asymptotical cutoffs derived under assumption of normality of the analyzed data.
Keywords :
biometrics (access control); computerised instrumentation; data analysis; biometrical data; data analysis; high-dimensional data; multivariate measurement data; outliers; Bioinformatics; Biological cells; Biometrics; Computer science; Data analysis; Data engineering; Frequency; Fungi; Informatics; Robustness; outliers; principal components and SVD; robust Mahalanobis distances; robust estimate;
Conference_Titel :
Biometrics and Kansei Engineering, 2009. ICBAKE 2009. International Conference on
Conference_Location :
Cieszyn
Print_ISBN :
978-0-7695-3692-7
Electronic_ISBN :
978-0-7695-3692-7
DOI :
10.1109/ICBAKE.2009.47
