Title :
Experimental analysis of short-circuit line technique for measuring permeability of ferromagnetic materials
Author :
Bregar, V.B. ; Lisjak, D. ; Nidarsic, A. ; Drofenik, M.
Author_Institution :
Kolektor Group Feriti, Ljubljana, Slovenia
Abstract :
Measurement of S-parameters in order to determine permeability and permittivity of materials is a well-established method, which has already been analyzed in great detail. However, the focus of the analysis has been the permittivity of dielectric materials. We have analyzed experimentally the short-circuit line technique for the determination of the permeability of ferrimagnetic materials, especially in the vicinity of ferromagnetic resonance where the material has high magnetic losses. We analyzed the fact that, by using samples with different lengths, we obtained different values for permeability and evaluated the difference as a function of sample length. Further, we compared the results obtained by single-sample and two-sample techniques and evaluated the influence of the distance between the sample and short circuit. The results were compared with the uncertainties due to measurement errors (sample length, sample position, reference plane position). We have analyzed sintered ferrite materials and also compared the inevitable variability of the samples´ permeability characteristics.
Keywords :
ferrites; ferromagnetic materials; ferromagnetic resonance; magnetic permeability; magnetic permeability measurement; measurement errors; S-parameter measurement; ferrimagnetic materials; ferromagnetic material permeability measurement; ferromagnetic resonance; magnetic losses; measurement errors; reference plane position; sample length; sample position; short-circuit line technique; sintered ferrite materials; Dielectric materials; Dielectric measurements; Ferrimagnetic materials; Magnetic analysis; Magnetic losses; Magnetic materials; Magnetic resonance; Permeability measurement; Permittivity measurement; Scattering parameters;
Conference_Titel :
Microwave Measurements Conference, Fall 2004. 64th ARFTG
Print_ISBN :
0-7803-8952-2
DOI :
10.1109/ARFTGF.2004.1427581