DocumentCode
3147354
Title
Compact thermal models: Assessment and pitfalls
Author
Kung, Jaeha ; Shin, Youngsoo
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear
2011
fDate
17-18 Nov. 2011
Firstpage
337
Lastpage
340
Abstract
Thermal analysis involves solving a differential equation, thus inherently takes a long time. Any thermal optimization techniques require a compact model that can be evaluated fast while accuracy is not sacrificed too much. Several models have been proposed, but their accuracy and runtime have not been fully understood and compared. Three models, namely resistive network, heat diffusion measure, and thermal signature, are studied; a series of experiments reveals that thermal signature is clearly a model of choice. Power density is a key parameter in thermal analysis, and is usually given as a constant value, which corresponds to the average over the region a block occupies and over the time period it operates. The error as a result of approximation is often unnoticed; this is studied in a quantitative way for the first time.
Keywords
differential equations; thermal analysis; compact model; compact thermal model; differential equation; heat diffusion measure; power density; resistive network; thermal analysis; thermal optimization; thermal signature;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2011 International
Conference_Location
Jeju
Print_ISBN
978-1-4577-0709-4
Electronic_ISBN
978-1-4577-0710-0
Type
conf
DOI
10.1109/ISOCC.2011.6138779
Filename
6138779
Link To Document