• DocumentCode
    3147370
  • Title

    A 18.85 mW 20–29 GHz wideband CMOS LNA with 3.85±0.25 dB NF and 18.1±1.9 dB gain

  • Author

    Chiu, Yi-Ting ; Lin, Yo-Sheng ; Chang, Jin-Fa

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chi Nan Univ., Puli, Taiwan
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    381
  • Lastpage
    384
  • Abstract
    A 20-29 GHz wideband CMOS low-noise amplifier (LNA) with flat and low noise figure (NF), flat and high gain (S21), and excellent phase linearity property (group-delay-variation is only ±22.6 ps across the whole band) is demonstrated. To achieve flat and low NF, the size, layout and bias of the input transistor were first optimized for minimum NF, and then the inductance of the input inductors was tuned to obtain a slightly under-damped (flat) NF frequency response. In addition, to achieve flat and high S21 and small group-delay-variation, the inductive-peaking technique was adopted in the current-reused stage for bandwidth enhancement. The LNA consumed 18.85 mW power and achieved flat and low NF of 3.85±0.25 dB, and flat and high S21 of 18.1±1.9 dB over the 20-29 GHz band of interest. These are the best NF and S21 performances ever reported for a 21.65-26.65 GHz or a 22-29 GHz wideband CMOS LNA.
  • Keywords
    CMOS integrated circuits; circuit noise; frequency response; low noise amplifiers; bandwidth enhancement; current-reused stage; frequency 20 GHz to 29 GHz; frequency response; group-delay-variation; inductive-peaking technique; input inductors; low-noise amplifier; noise figure; phase linearity property; power 18.85 mW; wideband CMOS LNA; Bandwidth; Frequency response; Gain; Inductance; Inductors; Linearity; Low-noise amplifiers; Noise figure; Noise measurement; Wideband; CMOS; gain; linearity; low-noise amplifier; low-power; wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517800
  • Filename
    5517800