• DocumentCode
    3147629
  • Title

    The polarization state in VDF/TrFE copolymer thin films studied by scanning probe microscopy

  • Author

    Tomoda, Naoko ; Takahashi, Yoshiyuki ; Furukawa, Takeo

  • Author_Institution
    Dept. of Chem., Tokyo Univ. of Sci., Tokyo
  • fYear
    2008
  • fDate
    15-17 Sept. 2008
  • Abstract
    Copolymers of vinylidene fluoride, VDF, and trifluoroethylene, TrFE, are representative ferroelectric polymers. Their local properties, such as domain structure and domain wall motion, are not well known because of its complex structure. In the isothermally crystallized samples, we can obtain lamellae that grow separately on the substrates. Then in order to discuss the local state of the polarization in VDF/TrFE copolymer thin films, we observed piezoelectric response images and surface potential images of the samples by piezoresponse force microscopy, PFM, and Kelvin force microscopy, KFM, respectively. We found that the piezoelectric response and/or surface potential depend on the crystal morphology. For example, piezoelectric response was large for edge-on lamellae, while it was weaker for flat-on lamellae. We also examined the change of these images due to the poling treatment.
  • Keywords
    crystal morphology; dielectric polarisation; ferroelectric thin films; piezoelectricity; polymer blends; polymer films; scanning probe microscopy; surface potential; copolymers; crystal morphology; edge-on lamellae; ferroelectric polymers; flat-on lamellae; piezoelectric response; piezoresponse force microscopy; polarization state; poling treatment; scanning probe microscopy; surface potential; thin films; trifluoroethylene; vinylidene fluoride; Crystallization; Ferroelectric materials; Kelvin; Piezoelectric films; Piezoelectric polarization; Polymer films; Response surface methodology; Scanning probe microscopy; Surface morphology; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2008. ISE-13. 13th International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-1850-3
  • Electronic_ISBN
    978-1-4244-1851-0
  • Type

    conf

  • DOI
    10.1109/ISE.2008.4814060
  • Filename
    4814060