DocumentCode :
3147645
Title :
Evaluating shock wavefront structure of amorphous polymers by piezofilm stress gauge
Author :
Sato, Y. ; Furukawa, T.
Author_Institution :
Tohoku Gakuin Univ., Tagajo
fYear :
2008
fDate :
15-17 Sept. 2008
Abstract :
In general, PVDF gauges can be operated in either current or charge mode. In this paper the charge mode has been revised twice to gain a higher time resolution of shock wavefront structure in amorphous polymers, such as PMMA and polycarbonate (PC).
Keywords :
piezoelectric thin films; polymers; shock wave effects; shock waves; strain gauges; PVDF gauge; amorphous polymers; nanosecond Lagrangian analysis; piezofilm stress gauge; plate impact test; shock wavefront structure; unsteady wave sensing system; Amorphous materials; Charge measurement; Current measurement; Electric shock; Equations; Equivalent circuits; Ferroelectric materials; Piezoelectricity; Polymers; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2008. ISE-13. 13th International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-1850-3
Electronic_ISBN :
978-1-4244-1851-0
Type :
conf
DOI :
10.1109/ISE.2008.4814061
Filename :
4814061
Link To Document :
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