DocumentCode :
3147888
Title :
Examination of the risk of flash X-ray induced breakdown in pressurised electrical enclosures
Author :
Pigneret, J.
Author_Institution :
Nucletudes SA, Les Ulis, France
fYear :
1991
fDate :
9-12 Sep 1991
Firstpage :
548
Lastpage :
552
Abstract :
Disruptive breakdown in gas triggered by flash X-rays is studied. For relevant electrode geometries found in electrical and electronic boxes, filled with air, nitrogen or SF6 under a pressure between 1 and 1000 millibars, is noticed a drop in the breakdown threshold voltage when the dose rate is higher than 1E8 rad (Si)/s. The maximum drop appears at about 1E10 rad (Si)/s but is never higher than half of the static BV. For higher dose rates (1E11-1E12) the breakdown voltage tends to increase, due to the higher charge density created in the gas, which precludes to the filament formation. The impact of solid dielectrics on the phenomena is evaluated, and a protection strategy is proposed
Keywords :
X-ray effects; electric breakdown of gases; gaseous insulation; 1 to 1000 mbar; N2; SF6; air; breakdown threshold voltage; disruptive breakdown; dose rate; flash X-ray induced breakdown; gas breakdown; pressurised electrical enclosures; protection strategy; solid dielectrics; Breakdown voltage; Electric breakdown; Electrodes; Geometry; Nitrogen; Polarization; Protection; Solids; Sulfur hexafluoride; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
Type :
conf
DOI :
10.1109/RADECS.1991.213531
Filename :
213531
Link To Document :
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