DocumentCode
3147889
Title
In-plane homogeneity of polarization in thin VDF-TrFE copolymer films
Author
Ploss, B. ; Takahashi, Y. ; Furukawa, T.
Author_Institution
Dept. of SciTec, Univ. of Appl. Sci. (FH) Jena, Jena
fYear
2008
fDate
15-17 Sept. 2008
Abstract
Annealing of thin copolymer films of vinylidene fluoride (VDF) and trifluoroethylene (TrFE) causes a strong increase in grain size as well as in crystallinity. It is known from AFM topographic images that flat-on lamella with diameters of up to 100 mum grow when thin films are annealed at temperatures around 140degC for several hours. To examine the orientation and the polarization state of the lamella, two dimensional images of the pyroelectric activity have been recorded.
Keywords
annealing; atomic force microscopy; grain size; polymer blends; polymer films; pyroelectricity; AFM topographic images; annealing; atomic force microscopy; crystallinity; grain size; in plane polarization homogeneity; pyroelectric activity; thin VDF-TrFE copolymer films; trifluoroethylene; vinylidene fluoride; Annealing; Atomic force microscopy; Ferroelectric films; Ferroelectric materials; Grain size; Polarization; Pyroelectricity; Substrates; Surface topography; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 2008. ISE-13. 13th International Symposium on
Conference_Location
Tokyo
Print_ISBN
978-1-4244-1850-3
Electronic_ISBN
978-1-4244-1851-0
Type
conf
DOI
10.1109/ISE.2008.4814071
Filename
4814071
Link To Document