Title :
In-plane homogeneity of polarization in thin VDF-TrFE copolymer films
Author :
Ploss, B. ; Takahashi, Y. ; Furukawa, T.
Author_Institution :
Dept. of SciTec, Univ. of Appl. Sci. (FH) Jena, Jena
Abstract :
Annealing of thin copolymer films of vinylidene fluoride (VDF) and trifluoroethylene (TrFE) causes a strong increase in grain size as well as in crystallinity. It is known from AFM topographic images that flat-on lamella with diameters of up to 100 mum grow when thin films are annealed at temperatures around 140degC for several hours. To examine the orientation and the polarization state of the lamella, two dimensional images of the pyroelectric activity have been recorded.
Keywords :
annealing; atomic force microscopy; grain size; polymer blends; polymer films; pyroelectricity; AFM topographic images; annealing; atomic force microscopy; crystallinity; grain size; in plane polarization homogeneity; pyroelectric activity; thin VDF-TrFE copolymer films; trifluoroethylene; vinylidene fluoride; Annealing; Atomic force microscopy; Ferroelectric films; Ferroelectric materials; Grain size; Polarization; Pyroelectricity; Substrates; Surface topography; Transistors;
Conference_Titel :
Electrets, 2008. ISE-13. 13th International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-1850-3
Electronic_ISBN :
978-1-4244-1851-0
DOI :
10.1109/ISE.2008.4814071
