• DocumentCode
    3147913
  • Title

    The UK5000 - Successful Collaborative Development of an Integrated Design System for a 5000 Gate CMOS Array with Built-In Test

  • Author

    Grierson, J.R. ; Cosgrove, B. ; Daniel, R. ; Halliwell, R.E. ; Kirk, I.H. ; Knight, J.C. ; McLean, J.A. ; McGrail, J.M. ; Newton, C.O.

  • Author_Institution
    British Telecom Research Labs., Martlesham Heath, Ipswich, UK
  • fYear
    1983
  • fDate
    27-29 June 1983
  • Firstpage
    629
  • Lastpage
    636
  • Abstract
    Following a UK Department of Industry initiative, the UK5000 project was launched in July 1981 on a 2 year timescale by 7 autonomous UK organizations with different computer systems. The activity involved the collaborative development of an integrated design system for a 5000 gate CMOS array. The DA system was to be portable and capable of generating layouts and test programs from logic circuit descriptions in a time of the order of one week. The CMOS array is unique in containing rows of dedicated bistables, preformed on chip into a shift loop for scan path testing with a totally synchronous clocking scheme. The dedicated bistables, clock lines, shift loops etc, together with the synchronous design lead to lower routeing requirements, elimination of timing hazards and excellent testability.
  • Keywords
    Built-in self-test; Circuit testing; Clocks; Collaboration; Computer industry; Hazards; Logic circuits; Logic testing; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1983. 20th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0026-8
  • Type

    conf

  • DOI
    10.1109/DAC.1983.1585721
  • Filename
    1585721