DocumentCode
3147913
Title
The UK5000 - Successful Collaborative Development of an Integrated Design System for a 5000 Gate CMOS Array with Built-In Test
Author
Grierson, J.R. ; Cosgrove, B. ; Daniel, R. ; Halliwell, R.E. ; Kirk, I.H. ; Knight, J.C. ; McLean, J.A. ; McGrail, J.M. ; Newton, C.O.
Author_Institution
British Telecom Research Labs., Martlesham Heath, Ipswich, UK
fYear
1983
fDate
27-29 June 1983
Firstpage
629
Lastpage
636
Abstract
Following a UK Department of Industry initiative, the UK5000 project was launched in July 1981 on a 2 year timescale by 7 autonomous UK organizations with different computer systems. The activity involved the collaborative development of an integrated design system for a 5000 gate CMOS array. The DA system was to be portable and capable of generating layouts and test programs from logic circuit descriptions in a time of the order of one week. The CMOS array is unique in containing rows of dedicated bistables, preformed on chip into a shift loop for scan path testing with a totally synchronous clocking scheme. The dedicated bistables, clock lines, shift loops etc, together with the synchronous design lead to lower routeing requirements, elimination of timing hazards and excellent testability.
Keywords
Built-in self-test; Circuit testing; Clocks; Collaboration; Computer industry; Hazards; Logic circuits; Logic testing; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1983. 20th Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0026-8
Type
conf
DOI
10.1109/DAC.1983.1585721
Filename
1585721
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