Title :
Proton irradiation of SRAM at SATURNE: results and conclusions about the experiment
Author :
Mijuin, D. ; Simon, E. ; Buisson, J. ; Brunet, J.P. ; Murat, J. ; Chapuis, T. ; Milleret, G.
Author_Institution :
CEA/DTA/LETI/DEIN/SIR CENS, Gif-sur-Yvette, France
Abstract :
The authors are studying the behaviour of electronic components submitted to the type of radiations encountered by satellites in orbits or by planetary probes. To simulate the effects of protons, an experimental line to irradiate electronic components has been set up at the SATURNE synchrotron. After a short description of the experiment, the results of the last test campaigns are presented. A method to valid the experimental results is also proposed
Keywords :
CMOS integrated circuits; SRAM chips; integrated circuit testing; proton effects; 100 to 800 MeV; 50 to 200 MeV; CMOS; SATURNE synchrotron; SEU testing; SRAM; effects of protons; electronic components; space environment testing; upset cross-section; Cams; Collaboration; Electronic components; Electronic equipment testing; Energy measurement; Protons; Pulse measurements; Random access memory; Synchrotrons; System testing;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213537
