DocumentCode :
3148131
Title :
Influence of environmental parameters and testing process during microprocessor experiments with low irradiation dose rates
Author :
Laviron, A. ; Gerard, G. ; Gauthier, G. ; Henry, J.Y. ; Meur, M. Le
Author_Institution :
IPSN, Centre d´´etudes de Valduc, CEA, Is-sur-Tille, France
fYear :
1991
fDate :
9-12 Sep 1991
Firstpage :
529
Lastpage :
533
Abstract :
Within the framework of nuclear safety studies, an experimental program has been initiated some years ago in order to determine the most important parameters to take into account for experiments on microprocessors placed in a low dose rate nuclear irradiation environment. The authors, after briefly describing the preceding published results, present the most recent results obtained especially about the effects of the temperature, the origin of the batches, the angle of the incident irradiation, the used testing device
Keywords :
integrated circuit testing; microprocessor chips; radiation effects; radiation hardening (electronics); environmental parameters; low irradiation dose rates; microprocessor experiments; nuclear irradiation environment; testing process; Circuit testing; Cobalt; Degradation; Microprocessors; Resumes; Safety; System testing; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
Type :
conf
DOI :
10.1109/RADECS.1991.213544
Filename :
213544
Link To Document :
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