Title :
An expectation-maximization approach assisted by dempster-shafer theory and its application to sonar image segmentation
Author :
Fei, Tai ; Kraus, Dieter
Author_Institution :
IWSS, Univ. of Appl. Sci. Bremen, Bremen, Germany
Abstract :
In this paper we deal with an unsupervised segmentation approach for images given by a synthetic aperture sonar (SAS). The images with objects are segmented into highlight, background and shadow. Since the shape features are extracted from these segmented images, correctness and precision of the segmentation are highly required. We improve the expectation-maximization (EM) methods of Sanjay-Gopal et al. by using the gamma mixture model. Moreover an intermediate step (I-step) based on Dempster-Shafer theory (DST) is introduced between the E- and M-steps of the EM to consider the pixel spatial dependency. Finally, numerical tests are carried out on both synthetic images and SAS images. The results are compared to iterative conditional mode (ICM) and diffused EM (DEM). Our approach provides segmentations with less false alarms and better shape preservation.
Keywords :
electrical engineering computing; feature extraction; image segmentation; inference mechanisms; iterative methods; optimisation; radar computing; sonar imaging; synthetic aperture sonar; uncertainty handling; DEM; DST; Dempster-Shafer theory; E-step; I-step; ICM; M-step; SAS; diffused EM; expectation-maximization approach; false alarm; gamma mixture model; intermediate step; iterative conditional mode; numerical tests; object segmentation; pixel spatial dependency; shape feature extraction; shape preservation; sonar image segmentation; synthetic aperture sonar; unsupervised segmentation approach; Classification algorithms; Clustering methods; Image segmentation; Indexes; Probability density function; Shape; Synthetic aperture sonar; Clustering methods; Dempster-Shafer theory; Expectation-maximization algorithms; Theory of evidence; image segmentation;
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-0045-2
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2012.6288093