DocumentCode :
3148337
Title :
Anti-biased RF MEMS varactor topology for 20–25 dB linearity enhancement
Author :
Chen, Kenle ; Kovacs, Andrew ; Peroulis, Dimitrios
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1142
Lastpage :
1145
Abstract :
A new topology for significantly improving the linearity of RF MEMS varactors is reported in this paper. A single MEMS varactor subject to a low frequency noise and/or modulating signal is the main structure under consideration. The key idea is to separate the single varactor into two varactors in parallel, which are anti-biased. This leads to out-of-phase vibration of the two beams under the influence of the low-frequency noise and/or modulating signal, which eventually leads to a nearly constant capacitance value of the entire topology. The effectiveness of the new method is demonstrated by both measured results from fabricated RF MEMS varactors and simulated results using a large-signal model of MEMS varactor in Agilent´s Advanced Design System (ADS). Both experimental and simulated results indicate an improvement of 20-25 dB compared to the conventional design when the varactors are biased close to their pull-in voltage and the low-frequency signal is close to their self-resonant frequency. This underlines the potential of the proposed topology in high-power RF MEMS circuits.
Keywords :
micromechanical devices; varactors; vibrations; Agilent´s advanced design system; anti-biased RF MEMS varactor topology; beams; linearity enhancement; low frequency noise; modulating signal; out-of-phase vibration; Capacitance; Circuit simulation; Linearity; Low-frequency noise; Micromechanical devices; Optical modulation; Radiofrequency microelectromechanical systems; Signal design; Topology; Varactors; Intermodulation; Linearity; RF MEMS varactor; Vibration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517852
Filename :
5517852
Link To Document :
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