DocumentCode :
3148374
Title :
A method to select correct stimuli levels for S-functions behavioral model extraction
Author :
Myslinski, Maciej ; Verbeyst, Frans ; Vanden Bossche, Marc ; Schreurs, Dominique
Author_Institution :
Div. ESAT-Telemic, K.U. Leuven, Leuven, Belgium
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1170
Lastpage :
1173
Abstract :
S-functions and other frequency-domain behavioral models based on describing functions rely on the linearization of the response of a nonlinear RF or microwave component around a set of large-signal operating points. To assure the validity of the linearization principle, and thus the validity of the model, one has to select appropriate stimuli levels during the experiments which are performed to extract the model parameters. In this work we propose a formal procedure to identify the correct small-signal power levels using a system identification approach, i.e. taking the uncertainty of the measured data into account. The method is based on the analysis of the cost function of an errors-in-variables (EIV) estimator obtained for simple models.
Keywords :
frequency-domain analysis; high electron mobility transistors; microwave field effect transistors; network analysers; parameter estimation; semiconductor device measurement; S-function behavioral model extraction; cost function analysis; error-in-variable estimator; frequency-domain behavioral models; large-signal network analyzer; large-signal operating points; microwave component; nonlinear RF component; packaged pHEMT device; small-signal power levels; stimuli levels; system identification approach; Cost function; Data mining; Hafnium oxide; Measurement uncertainty; Microwave measurements; Power measurement; Power system modeling; Radio frequency; Signal processing; System identification; Describing functions; identification; microwave measurements; modeling; nonlinear systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517853
Filename :
5517853
Link To Document :
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