DocumentCode :
3148378
Title :
Return voltage measurements: Theory and applications to charge injection monitoring
Author :
Molinie, P. ; Koch, Delphine ; Llovera, Pedro
Author_Institution :
Supelec, Plateau de Moulon, Gif-sur-Yvette
fYear :
2008
fDate :
15-17 Sept. 2008
Abstract :
Charge injection is in many cases a step towards the breakdown of insulating materials. Although modern charge mapping techniques exist, they might be too expensive or difficult to use in an industrial laboratory environment, and an alternative solution for charge injection monitoring, especially on thin films, could be measurements of the return potential. The return voltage occurs when an insulator charged during a period of time cannot be neutralized by a short circuit whose duration is short compared to the charging time. Either relaxation of slow dipolar movements, or the return towards the electrodes of a dissymmetrical internal space charge distribution can be held responsible for the return potential. Charge injection from the electrodes usually gives birth to such a dissymmetrical distribution (though not necessarily).
Keywords :
charge injection; electric breakdown; insulation testing; voltage measurement; breakdown; charge injection monitoring; charge mapping; dissymmetrical internal space charge distribution; electrodes; industrial laboratory; insulating materials; relaxation; return voltage measurement; slow dipolar movement; Absorption; Dielectrics; Electric breakdown; Electrodes; Electrostatic measurements; Insulation; Linearity; Monitoring; Thin film circuits; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2008. ISE-13. 13th International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4244-1850-3
Electronic_ISBN :
978-1-4244-1851-0
Type :
conf
DOI :
10.1109/ISE.2008.4814094
Filename :
4814094
Link To Document :
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