• DocumentCode
    3148472
  • Title

    Golay (20, 8) C code simulation and implementation in DSP chip

  • Author

    Chen, Yi Hua ; Hsiao, Jue Hsuan ; Liu, Pang-Fu ; He, Jheng-Shyuan

  • Author_Institution
    Inst. of Inf. & Commun. Eng., Oriental Inst. of Technol., Taipei, Taiwan
  • fYear
    2011
  • fDate
    16-18 April 2011
  • Firstpage
    4990
  • Lastpage
    4994
  • Abstract
    This study analyzed and simulated special Golay (20, 8) channel code. When the bit error probability Pb = 10-5, Hamming (16, 11) has about 0.5dB coding gain compared with Golay Code (20,8) t = 3, and Golay Code (20,8) t = 4 has about 0.2dB coding gain compared with Hamming (16, 11). Thus, Golay Code (20, 8) t = 4 has about 0.7dB coding gain compared with Golay Code (20,8) t = 3. This study also analyzed the Golay Code (20,8) decoding correction capability. The simulation result showed that the cause is when 212 syndromes are all used, partial 4-bit errors can be corrected. The error pattern that can be corrected is increased by 67.04% compared with only correcting 3-bit errors. When the C code system program is constructed, the system program should be optimized and realized on the DSP platform. The further goal is to be applied to the wireless communication system of SDR concept, so that different modulation and encoding modes can adjust parameters in firmware directly according to different system specification requirements.
  • Keywords
    Golay codes; Hamming codes; decoding; digital signal processing chips; error statistics; probability; DSP chip; DSP platform; Golay code; Hamming code; bit error probability; channel code; correction capability decoding; partial errors; wireless communication system; Binary phase shift keying; Decoding; Encoding; Equations; Error probability; Generators; Lead; C Code; Coding Gain; DSP; Golay Code; Hamming Code; Perfect Code; SDR; Syndrome;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics, Communications and Networks (CECNet), 2011 International Conference on
  • Conference_Location
    XianNing
  • Print_ISBN
    978-1-61284-458-9
  • Type

    conf

  • DOI
    10.1109/CECNET.2011.5768240
  • Filename
    5768240