• DocumentCode
    3148497
  • Title

    The effect of resonance phenomena on the characteristics of a chamber

  • Author

    Chen, Liu

  • Author_Institution
    GW Technol. Co. Ltd., Beijing, China
  • fYear
    2002
  • fDate
    21-24 May 2002
  • Firstpage
    401
  • Lastpage
    403
  • Abstract
    This paper describes the study of the effect of resonance phenomena on the chamber´s characteristics, which mainly refers to the normalized site attenuation (NSA). The NSA test results of a 12.6×7.8×6 m3 chamber are presented as an example to discuss the influence of resonance phenomena on the NSA characteristic of the chamber. A new structure of a chamber is put forward to eliminate the influence of the resonance phenomena and improve the NSA characteristic of the chamber.
  • Keywords
    anechoic chambers (electromagnetic); electromagnetic compatibility; electronic equipment testing; EMC; NSA; anechoic chamber; electromagnetic compatibility; normalized site attenuation; resonance phenomena; Attenuation measurement; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic scattering; Equations; Resonance; Resonant frequency; Surface impedance; Surface waves; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002 3rd International Symposium on
  • Print_ISBN
    0-7803-7277-8
  • Type

    conf

  • DOI
    10.1109/ELMAGC.2002.1177455
  • Filename
    1177455
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3148497