DocumentCode :
3148497
Title :
The effect of resonance phenomena on the characteristics of a chamber
Author :
Chen, Liu
Author_Institution :
GW Technol. Co. Ltd., Beijing, China
fYear :
2002
fDate :
21-24 May 2002
Firstpage :
401
Lastpage :
403
Abstract :
This paper describes the study of the effect of resonance phenomena on the chamber´s characteristics, which mainly refers to the normalized site attenuation (NSA). The NSA test results of a 12.6×7.8×6 m3 chamber are presented as an example to discuss the influence of resonance phenomena on the NSA characteristic of the chamber. A new structure of a chamber is put forward to eliminate the influence of the resonance phenomena and improve the NSA characteristic of the chamber.
Keywords :
anechoic chambers (electromagnetic); electromagnetic compatibility; electronic equipment testing; EMC; NSA; anechoic chamber; electromagnetic compatibility; normalized site attenuation; resonance phenomena; Attenuation measurement; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic scattering; Equations; Resonance; Resonant frequency; Surface impedance; Surface waves; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
Type :
conf
DOI :
10.1109/ELMAGC.2002.1177455
Filename :
1177455
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3148497
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