DocumentCode :
3148552
Title :
Magnetically tunable nanocomposites for microwave applications
Author :
Morales, Cesar ; Dewdney, Julio ; Pal, Shovon ; Stojak, Kristen ; Srikanth, Hariharan ; Wang, Jing ; Weller, Thomas
Author_Institution :
Center for Wireless & Microwave Inf. Syst., Univ. of South Florida, Tampa, FL, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1340
Lastpage :
1343
Abstract :
In this work, tunability of the microwave properties of Magneto-Dielectric Polymer Nanocomposites (MDPNCs) has been demonstrated for the first time. Particularly, permeability, permittivity and loss factor were tuned by an externally applied DC magnetic field with strength achievable by commercial permanent magnets. The considerable tunability, ease of manufacturing, compatibility with multilayer RF laminates and substrate implementation make this material well-suited for use in tunable microwave circuits. Two custom-built microstrip test fixtures using multi-layer substrates were employed to extract the permeability, permittivity and loss tangent of MDPNCs using S-parameter measurements.
Keywords :
S-parameters; dielectric materials; ferrimagnetic materials; iron compounds; magnetic permeability; microwave materials; multilayers; nanocomposites; permittivity; polymers; DC magnetic field; Fe3O4; S-parameter measurements; commercial permanent magnet; custom built microstrip; loss factor; magnetically tunable nanocomposite; magneto-dielectric polymer nanocomposites; microwave applications; microwave properties tunability; multilayer RF laminates; multilayer substrates; permeability; permittivity; substrate implementation; tunable microwave circuit; Magnetic fields; Magnetic multilayers; Magnetic properties; Manufacturing; Nanocomposites; Permanent magnets; Permeability; Permittivity; Polymers; Tunable circuits and devices; Nanocomposites; dielectric losses; magnetic losses; microstrip resonators; permeability; permittivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517860
Filename :
5517860
Link To Document :
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