Title :
A Markov reward model for reliable synchronous dataflow system design
Author :
Kumar, Vinu Vijay ; Verma, Rashi ; Lach, John ; Dugan, Joanne Bechta
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA, USA
fDate :
28 June-1 July 2004
Abstract :
The design of quality digital systems depends on models that accurately evaluate various options in the design space against a set of prioritized metrics. While individual models for evaluating area, performance, reliability, power, etc. are well established, models combining multiple metrics are less mature. This paper introduces a formal methodology for comprehensively analyzing performance, area and reliability in the design of synchronous dataflow systems using a novel Markov Reward Model. A Markov chain system reliability model is constructed for various design options in the presence of possible component failures, and high-level synthesis techniques are used to associate performance and area rewards with each state in the chain. The cumulative reward for a chain is then used to evaluate the corresponding design option with respect to the metrics of interest. Application of the model to a benchmark DSP circuit provides insights into reliable synchronous dataflow system design.
Keywords :
Markov processes; digital signal processing chips; formal verification; high level synthesis; reliability; DSP circuit; Markov chain; Markov reward model; digital systems design; synchronous dataflow systems; system reliability model; Costs; Digital signal processing; Digital systems; Fault tolerant systems; Performance analysis; Power engineering computing; Power system modeling; Power system reliability; Reliability engineering; Throughput;
Conference_Titel :
Dependable Systems and Networks, 2004 International Conference on
Print_ISBN :
0-7695-2052-9
DOI :
10.1109/DSN.2004.1311952