Title :
Fast, configurable over-current protection for high-power modules
Author :
Graves, Ryan ; Lemmon, Andrew ; Gant, Levi
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alabama, Tuscaloosa, AL, USA
Abstract :
Protection from over-current situations and the resulting risk of device failure is a requirement when testing limited-run, experimental modules. This paper demonstrates a fast, configurable, and consistent means for protecting against over-current conditions during Clamped Inductive Load (CIL) testing of 10 kV SiC MOSFET modules. This protection circuit offers the user a convenient method of selecting a desired trip current. The protection circuit is able to sense current in the power loop of the CIL test stand, and will interrupt power to the device-under-test (DUT) upon detecting an over-current condition. A method of predicting and compensating the small delay introduced by the gate drive of the protection circuit is also demonstrated.
Keywords :
compensation; delays; overcurrent protection; power MOSFET; risk analysis; silicon compounds; CIL testing; MOSFET module; SiC; clamped inductive load; configurable overcurrent protection circuit; delay compensation; delay prediction; device failure risk; device-under-test; gate drive; power loop; trip current; voltage 10 kV; Capacitors; Delays; Insulated gate bipolar transistors; Integrated circuits; Logic gates; Silicon carbide; Testing; IGBT; SiC; Silicon Carbide; clamped inductive load; de-saturation; desat; inductance; over-current; parasitic; protection; wide band-gap;
Conference_Titel :
Electric Ship Technologies Symposium (ESTS), 2015 IEEE
Conference_Location :
Alexandria, VA
Print_ISBN :
978-1-4799-1856-0
DOI :
10.1109/ESTS.2015.7157914
