Title :
Particle radiation effects in charge coupled devices (CCDs) with applications in single event experiments
Author_Institution :
DLR Inst. for Aerosp. Medizin, Koln, Germany
Abstract :
The investigation of radiation effects in particle radiation fields requires the detection of single particles and their individual correlation with the observed quantity. With Charge Coupled Devices (CCDs) of the frame transfer type NXA 1011 particle radiation effects in the sensor matrix have been investigated. The application of these devices as detectors in single particle correlated experiments is demonstrated for the investigation of single event upsets in electronics and in the field of particle radiobiology with metabolizing systems
Keywords :
CCD image sensors; alpha-particle effects; ion beam effects; proton effects; semiconductor counters; CCD imagers; charge coupled devices; frame transfer type; ionising particle radiation; metabolizing systems; particle radiation fields; particle radiobiology; radiation effects; single event experiments; single event upsets; single particle correlated experiments; time resolving particle detector; Aerospace materials; Charge coupled devices; Charge-coupled image sensors; Event detection; Image analysis; Image storage; Ionizing radiation; Radiation detectors; Radiation effects; Single event upset;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213576
