• DocumentCode
    3148875
  • Title

    An Experimental MOS Fault Simulation Program CSASIM

  • Author

    Kawai, Masato ; Hayes, John P.

  • Author_Institution
    NEC Corporation, Tokyo, Japan
  • fYear
    1984
  • fDate
    25-27 June 1984
  • Firstpage
    2
  • Lastpage
    9
  • Abstract
    A prototype version of a new switch-level fault simulator for digital MOS IC´s is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.
  • Keywords
    Attenuators; Circuit faults; Circuit simulation; Computational modeling; Delay; National electric code; Resistors; Switching circuits; Virtual prototyping; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1984. 21st Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0542-1
  • Type

    conf

  • DOI
    10.1109/DAC.1984.1585765
  • Filename
    1585765