DocumentCode
3148875
Title
An Experimental MOS Fault Simulation Program CSASIM
Author
Kawai, Masato ; Hayes, John P.
Author_Institution
NEC Corporation, Tokyo, Japan
fYear
1984
fDate
25-27 June 1984
Firstpage
2
Lastpage
9
Abstract
A prototype version of a new switch-level fault simulator for digital MOS IC´s is described. The simulation program, which is called CSASIM, analyzes CSA (connector-switch-attenuator) circuit models using multiple logic values. A novel method of signal evaluation is employed, based on the superposition of bidirectional static and dynamic signals. CSASIM also allows efficient simulation of many different fault types, including stuck-at-constant, open-circuit, short-circuit, and delay faults. The internal structure and fault-simulation mechanisms of the simulator are discussed in this paper.
Keywords
Attenuators; Circuit faults; Circuit simulation; Computational modeling; Delay; National electric code; Resistors; Switching circuits; Virtual prototyping; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1984. 21st Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0542-1
Type
conf
DOI
10.1109/DAC.1984.1585765
Filename
1585765
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