Heavy ion effects on SPOT satellites comparison between on-orbit observation and upset rate prediction

Author

Chapuis, T. ; Ecoffet, R. ; Kerjean, L. ; Duzellier, S. ; Falguere, D. ; Rosier, L.H.

Author_Institution

CNES, Toulouse, France

fYear

1991

fDate

9-12 Sep 1991

Firstpage

302

Lastpage

306

Abstract

The authors describe the overall studies on SPOT1 and SPOT2 satellites, in order to assess the validity of upset rate prediction. Upset anomalies detected on OBC (On Board Computer) memory are dealt with. Heavy ion test results obtained during a recent campaign on the IPN Tandem accelerator are presented. The calculations done are summarized, pointing out the best choice of input parameters to achieve a realistic prediction. The goal is to improve the quality of event rate estimation, through a systematic collection of on-orbit anomalies related to charged particles

Keywords

aerospace instrumentation; aerospace simulation; artificial satellites; cosmic ray effects and interactions; ion beam effects; proton effects; SPOT satellites; VLSI circuits; charged particles; heavy ion effects; input parameters; on-board computer; on-orbit anomalies; on-orbit observation; upset rate prediction; Capacity planning; Circuits; Earth; Ion accelerators; Life estimation; Memory architecture; Protection; Random access memory; Satellites; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on

Conference_Location

La Grande-Motte

Print_ISBN

0-7803-0208-7

Type

conf

DOI

10.1109/RADECS.1991.213586

Filename

213586