DocumentCode
3149506
Title
Functional Verification of Memory Circuits from Mask Artwork Data
Author
Kawamura, Masahiko ; Takagi, Haruo ; Hirabayashi, Kanji
Author_Institution
TOSHIBA Research and Development Center, Kawasaki, JAPAN
fYear
1984
fDate
25-27 June 1984
Firstpage
228
Lastpage
234
Abstract
The timing simulator MACTIS was successfully applied to functional verification of MOS memory circuits from mask artwork data. The circuit description is extracted automatically from artwork data by the mask analysis program. Combining the macromodel technique and the code generation scheme, the timing simulation can be performed cost-effectively. MACTIS can handle circuits with analog features also, including bootstrapping effects, which cannot be done by logic and switch level simulators.
Keywords
Bismuth; Capacitance; Circuit simulation; Coupling circuits; Data mining; MOS devices; Variable structure systems; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1984. 21st Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0542-1
Type
conf
DOI
10.1109/DAC.1984.1585800
Filename
1585800
Link To Document