• DocumentCode
    3149524
  • Title

    The Scan Line Approach to Design Rules Checking: Computational Experiences

  • Author

    Chapman, P.T. ; Clark, K., Jr.

  • Author_Institution
    International Business Machines Corporation, IBM East Fishkill Facility, Hopewell Junction, NY
  • fYear
    1984
  • fDate
    25-27 June 1984
  • Firstpage
    235
  • Lastpage
    241
  • Abstract
    Advances in integrated circuit technology in the last several years have led to designs with ever-increasing complexity and density. Consequently, designers have been faced with performing design-rule-checking on designs with shape outlines that have been doubling in number every year or two. In response, we have recently incorporated efficient algorithms into our design checking strategy. This paper reports on the computational results of these efforts.
  • Keywords
    Algorithm design and analysis; Buildings; Chemical elements; Design for experiments; Explosions; Integrated circuit technology; Optical design; Physics computing; Shape; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1984. 21st Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0542-1
  • Type

    conf

  • DOI
    10.1109/DAC.1984.1585801
  • Filename
    1585801