DocumentCode
3149524
Title
The Scan Line Approach to Design Rules Checking: Computational Experiences
Author
Chapman, P.T. ; Clark, K., Jr.
Author_Institution
International Business Machines Corporation, IBM East Fishkill Facility, Hopewell Junction, NY
fYear
1984
fDate
25-27 June 1984
Firstpage
235
Lastpage
241
Abstract
Advances in integrated circuit technology in the last several years have led to designs with ever-increasing complexity and density. Consequently, designers have been faced with performing design-rule-checking on designs with shape outlines that have been doubling in number every year or two. In response, we have recently incorporated efficient algorithms into our design checking strategy. This paper reports on the computational results of these efforts.
Keywords
Algorithm design and analysis; Buildings; Chemical elements; Design for experiments; Explosions; Integrated circuit technology; Optical design; Physics computing; Shape; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1984. 21st Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0542-1
Type
conf
DOI
10.1109/DAC.1984.1585801
Filename
1585801
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