Title :
Characterization method of the total dose tolerance of a logic family: application to Texas Instruments HCMOS family
Author :
Maurel, J.-M. ; Villard, L. ; Adams, L.
Author_Institution :
Texas Instruments France, Villeneuve Loubet, France
Abstract :
Describes a characterization method to study the total dose tolerance of a logic family of S/C components. This method shows how to select critical parameters to demonstrate the tolerance as well as a way to define relevant sampling. An application to Texas Instruments high speed CMOS logic family is proposed. A discussion ends the paper showing the interest of such a method for the procurement phases and the need of expertise and control from semiconductor manufacturers of space parts
Keywords :
CMOS integrated circuits; integrated logic circuits; radiation hardening (electronics); HCMOS family; Texas Instruments; characterization method; critical parameters; logic family; procurement phases; sampling; space parts; total dose tolerance; CMOS logic circuits; Communication system control; Costs; Instruments; Job shop scheduling; Procurement; Pulp manufacturing; Sampling methods; Semiconductor device manufacture; Testing;
Conference_Titel :
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location :
La Grande-Motte
Print_ISBN :
0-7803-0208-7
DOI :
10.1109/RADECS.1991.213627
