Estimation of near-E field and far-field radiation pattern with only near-H field measurement by using the Yee scheme

Near-field measurement is done for the purpose of decreasing far-field emission from electric equipment. Measured fields are plotted, and then a region where the field intensity is strong is regarded to be taken a step. However, in current manufacturing facilities, plotting alone is insufficient to reduce the present emissions. In this paper, we propose a new method using the Yee scheme for near-field measurement. This method enables us to: 1) obtain the E-field distribution through only the H-field measurement; and 2) estimate the far-field radiation pattern by using only the measured H-field distribution. Our experiments confirmed the effectiveness of the method