DocumentCode
3150239
Title
An Automated System for Testing LSI Memory Chips
Author
Schnurmann, H.D. ; Vidunas, L.J. ; Peters, R.M.
Author_Institution
IBM General Technology Division, East Fishkill, Hopewell Junction, NY
fYear
1984
fDate
25-27 June 1984
Firstpage
454
Lastpage
458
Abstract
This paper describes a software system for testing LSI memory chips. This system achieves complete automation by customizing test data for a given part number design and by creating an overall test program to be used by a computer-controlled tester in a manufacturing environment. This system encompasses DC testing of the memory product and test sites, AC testing under a variety of timing conditions, and generating a complete set of AC functional test patterns.
Keywords
AC generators; Automatic testing; Computer aided manufacturing; Design automation; Large scale integration; Manufacturing automation; Software systems; Software testing; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1984. 21st Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0542-1
Type
conf
DOI
10.1109/DAC.1984.1585837
Filename
1585837
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