DocumentCode :
3150337
Title :
Taking into Account Asynchronous Signals in Functional Test of Complex Circuits
Author :
Bellon, C. ; Velazco, R.
Author_Institution :
Laboratoire "Circuits et Systemes" - Institut IMAG, Saint Martin D\´\´heres Cedex - France
fYear :
1984
fDate :
25-27 June 1984
Firstpage :
490
Lastpage :
496
Abstract :
The proposed functional test method for complex circuits presents the following features: the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed; the circuit behavior is considered as a whole, including the response to instructions (or commands), and to signals at the same level. Emphasis is put on the signal test; an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Hardware; Microprocessors; Pins; Programmable circuits; Signal generators; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1984. 21st Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0542-1
Type :
conf
DOI :
10.1109/DAC.1984.1585843
Filename :
1585843
Link To Document :
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