Title :
Functional Testing Techniques for Digital LSI/VLSI Systems
Author :
Su, Stephen Y H ; Lin, Tonysheng
Author_Institution :
Department of Computer Science, Thomas J. Watson School of Engineering, Applied Science and Technology, State University of New York, Binghamton, NY
Abstract :
Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Design automation; Integrated circuit testing; Large scale integration; Logic testing; Performance evaluation; System testing; Very large scale integration;
Conference_Titel :
Design Automation, 1984. 21st Conference on
Print_ISBN :
0-8186-0542-1
DOI :
10.1109/DAC.1984.1585847
