Title :
Novel blind identification of LDPC codes using average LLR of syndrome a posteriori probability
Author :
Tian Xia ; Hsiao-Chun Wu
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Louisiana State Univ., Baton Rouge, LA, USA
Abstract :
Blind signal processing methods have been very popular recently since they can play crucial roles in the prevalent cognitive radio research. Blind encoder identification has drawn immense research interest lately. In this paper, we make the first-ever attempt to tackle the blind low-density parity-check (LDPC) encoder identification for binary phase-shift keying (BPSK) signals. We propose a novel blind identification system which consists of three components, namely EM (expectation-maximization) estimator for signal amplitude and noise variance, LLR (log-likelihood ratio) estimator for syndrome a posteriori probabilities, and maximum average LLR detector. Monte Carlo simulation results demonstrate that our proposed new blind LDPC encoder identification scheme is very promising even for harsh channel environments with low signal-to-noise ratios.
Keywords :
Monte Carlo methods; adaptive codes; adaptive modulation; blind source separation; channel coding; cognitive radio; expectation-maximisation algorithm; parity check codes; phase shift keying; probability; AMC; BPSK; EM; LDPC code; LLR; Monte Carlo simulation; adaptive modulation and coding; binary phase shift keying; blind encoder identification; blind signal processing; cognitive radio; expectation-maximization estimator; harsh channel environment; log-likelihood ratio estimator; low density parity check; noise variance; signal amplitude; syndrome a posteriori probability; Binary phase shift keying; Parity check codes; Radio access networks; Receivers; Standards; Transmitters; Blind encoder identification; adaptive modulation and coding (AMC); low-density parity-check (LDPC) codes;
Conference_Titel :
ITS Telecommunications (ITST), 2012 12th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-3071-8
Electronic_ISBN :
978-1-4673-3069-5
DOI :
10.1109/ITST.2012.6425150