Title :
IEEE Std 1581 — A standardized test access methodology for memory devices
Author :
Ehrenberg, Heiko ; Russell, Bob
Author_Institution :
GOEPEL Electron., Austin, TX, USA
Abstract :
Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins.
Keywords :
DRAM chips; IEEE standards; integrated circuit testing; IEEE Std 1581; board level test application; memory device pin; standardized test access methodology; Clocks; Conferences; Frequency modulation; IEEE standards; Logic design; Logic gates; Pins;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139141
