Title :
Multi-site test of RF transceivers on low-cost digital ATE
Author :
Kore, Ivo ; Schuffenhauer, Ben ; Demmerle, Frank ; Neugebauer, Frank ; Pfahl, Gert ; Rautmann, Dirk
Author_Institution :
Intel Mobile Commun. GmbH, Neubiberg, Germany
Abstract :
In this paper we present a concept and its implementation for the productive quad-site test of a state-of-the-art 2G/3G RF transceiver device on a low-cost purely digital ATE. Our approach is based on calibrated reference RF transceiver device used as a compact, low-cost RF signal source and RF measurement instrument. The reference device along with supporting analog and digital circuitry for pattern control and test data handling is placed on PCB modules plugged on-top the test DUT board one for each site. The design of the modules, the DUT boards and the software is explained in the context of mass production, and measurement results are given.
Keywords :
automatic test equipment; printed circuits; radio transceivers; 2G-3G RF transceiver device; PCB modules; RF measurement instrument; RF transceivers; calibrated reference RF transceiver device; compact low-cost RF signal source; low-cost automated test equipment; low-cost purely digital ATE; mass production; multisite test; pattern control; productive quad-site test; test DUT board; test data handling; Accuracy; Field programmable gate arrays; Frequency measurement; RF signals; Radio frequency; Radiofrequency integrated circuits; Transceivers;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139142
