• DocumentCode
    3151642
  • Title

    Generic, orthogonal and low-cost March Element based memory BIST

  • Author

    Van de Goor, Ad J. ; Hamdioui, Said ; Kukner, Halil

  • Author_Institution
    ComTex, Gouda, Netherlands
  • fYear
    2011
  • fDate
    20-22 Sept. 2011
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper contributes to the field of MBIST architecture and implementation by addressing the two most area-critical components: the Command Memory (ComMem) and the Address Generator (AddrGen). The ComMem area is minimized by using a novel MBIST architecture, based on the Generic March Element (GME) concept. A GME is a March Element which specifies the required operations and the generic data values; it can be specified independent of the algorithm stresses. The AddrGen area is minimized by using an efficient implementation, based on a single Up-counter and a set of multiplexors. The experimental results show that the proposed MBIST outperforms the existing MBISTs in terms of area, power, speed, and flexibility. E.g., for a 16Kx16-bit memory, the proposed MBIST consumes about 40% less area and operates at least 1.6 times faster than the state-of-the art.
  • Keywords
    built-in self test; semiconductor storage; AddrGen; ComMem; address generator; command memory; generic March element; low cost March element; memory BIST; orthogonal March element; Algorithm design and analysis; Capacitance-voltage characteristics; Delay; Engines; Radiation detectors; Registers; Stress; Address Generators; Generic March Elements; MBIST; Memory Testing; Orthogonality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2011 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4577-0153-5
  • Type

    conf

  • DOI
    10.1109/TEST.2011.6139148
  • Filename
    6139148