Title :
Generic, orthogonal and low-cost March Element based memory BIST
Author :
Van de Goor, Ad J. ; Hamdioui, Said ; Kukner, Halil
Author_Institution :
ComTex, Gouda, Netherlands
Abstract :
This paper contributes to the field of MBIST architecture and implementation by addressing the two most area-critical components: the Command Memory (ComMem) and the Address Generator (AddrGen). The ComMem area is minimized by using a novel MBIST architecture, based on the Generic March Element (GME) concept. A GME is a March Element which specifies the required operations and the generic data values; it can be specified independent of the algorithm stresses. The AddrGen area is minimized by using an efficient implementation, based on a single Up-counter and a set of multiplexors. The experimental results show that the proposed MBIST outperforms the existing MBISTs in terms of area, power, speed, and flexibility. E.g., for a 16Kx16-bit memory, the proposed MBIST consumes about 40% less area and operates at least 1.6 times faster than the state-of-the art.
Keywords :
built-in self test; semiconductor storage; AddrGen; ComMem; address generator; command memory; generic March element; low cost March element; memory BIST; orthogonal March element; Algorithm design and analysis; Capacitance-voltage characteristics; Delay; Engines; Radiation detectors; Registers; Stress; Address Generators; Generic March Elements; MBIST; Memory Testing; Orthogonality;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139148