DocumentCode
3151921
Title
PLATYPUS: A PLA Test Pattern Generation Tool
Author
Wei, Ruey-Sing ; Sangiovanni-Vincentelli, Alberto
Author_Institution
Department of EECS, University of California, Berkeley, Berkeley, CA
fYear
1985
fDate
23-26 June 1985
Firstpage
197
Lastpage
203
Abstract
PLATypus (PLA Test pattern generation and logic simulation tool) is an efficient tool for large PLAs which is interfaced constrained/unconstrained, simple/multiple folding program PLEASURE and the logic minimizer ESPRESSO II-C developed at the University of California at Berkeley. PLATYPUS uses biased random test generation as a quick preprocess followed by a deterministic test generation process to achieve the best balance between efficient run time and test set minimality. The algorithm adopted in the deterministic phase is exact, i.e., it achieves the highest possible test coverage by generating a test for every testable fault. Powerful heuristics are introduced in the area of fault processing order, backend fault simulation, "don\´t-care" bit fixing, and on-the-fly test compaction to achieve the best performance of PLATYPUS. The deterministic test generation algorithm is based on both complementation and tautology check of a logic cover. Both complementation and tautology check are performed by an advanced method used in the logic minimizer ESPRESSO-II. PLATYPUS supports both folded and unfolded PLAs, and both crosspoint and stuck-at fault models. PLATYPUS can also be used as a logic simulation tool and redundancy identifier. Test pattern generation has been performed by PLATYPUS on a large number of industrial PLAs.
Keywords
Compaction; Feedback; Logic design; Logic testing; Performance evaluation; Programmable logic arrays; Redundancy; System testing; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1985. 22nd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0635-5
Type
conf
DOI
10.1109/DAC.1985.1585935
Filename
1585935
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