DocumentCode :
3151921
Title :
PLATYPUS: A PLA Test Pattern Generation Tool
Author :
Wei, Ruey-Sing ; Sangiovanni-Vincentelli, Alberto
Author_Institution :
Department of EECS, University of California, Berkeley, Berkeley, CA
fYear :
1985
fDate :
23-26 June 1985
Firstpage :
197
Lastpage :
203
Abstract :
PLATypus (PLA Test pattern generation and logic simulation tool) is an efficient tool for large PLAs which is interfaced constrained/unconstrained, simple/multiple folding program PLEASURE and the logic minimizer ESPRESSO II-C developed at the University of California at Berkeley. PLATYPUS uses biased random test generation as a quick preprocess followed by a deterministic test generation process to achieve the best balance between efficient run time and test set minimality. The algorithm adopted in the deterministic phase is exact, i.e., it achieves the highest possible test coverage by generating a test for every testable fault. Powerful heuristics are introduced in the area of fault processing order, backend fault simulation, "don\´t-care" bit fixing, and on-the-fly test compaction to achieve the best performance of PLATYPUS. The deterministic test generation algorithm is based on both complementation and tautology check of a logic cover. Both complementation and tautology check are performed by an advanced method used in the logic minimizer ESPRESSO-II. PLATYPUS supports both folded and unfolded PLAs, and both crosspoint and stuck-at fault models. PLATYPUS can also be used as a logic simulation tool and redundancy identifier. Test pattern generation has been performed by PLATYPUS on a large number of industrial PLAs.
Keywords :
Compaction; Feedback; Logic design; Logic testing; Performance evaluation; Programmable logic arrays; Redundancy; System testing; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1985. 22nd Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0635-5
Type :
conf
DOI :
10.1109/DAC.1985.1585935
Filename :
1585935
Link To Document :
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