• DocumentCode
    3152028
  • Title

    The low temperature switching performance of thyristors and MOSFETs

  • Author

    Hudgins, J.L. ; Menhart, S. ; Portnoy, W.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA
  • fYear
    1990
  • fDate
    0-0 1990
  • Firstpage
    429
  • Lastpage
    434
  • Abstract
    The measured switching performance of MOS-controlled thyristors (MCTs), an SCR (silicon-controlled rectifier), and a power MOSFET are discussed for operating temperatures from 25 to -180 degrees C. Current pulses of up to 340 A were conducted for a duration of 10 mu s. A comparison of the energy losses, switching times, and device behavior as a function of temperature is also presented. It is shown that under controlled situations, the MCT compares favorably when used at low ambient and junction temperatures. These devices turn on quickly enough to keep the switching losses small when conducting large currents, though at low current levels and high frequencies the MOSFET is still the superior device because of its very fast turn-on. Based on conduction losses at high current levels, the MCTs outperformed the other test devices.<>
  • Keywords
    insulated gate field effect transistors; power transistors; switching; thyristors; -180 to 25 degC; MOS-controlled thyristors; SCR; conduction losses; energy losses; junction temperatures; low temperature switching performance; power MOSFET; switching times; thyristors; turn-on; Anodes; Cryogenics; FETs; Frequency conversion; MOSFETs; Power engineering and energy; Power measurement; Power semiconductor switches; Temperature; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1990. PESC '90 Record., 21st Annual IEEE
  • Conference_Location
    San Antonio, TX, USA
  • Type

    conf

  • DOI
    10.1109/PESC.1990.131219
  • Filename
    131219