Title :
Optimal manufacturing flow to determine minumum operating voltage
Author :
Chakravarty, Sreejit ; Dang, Binh ; Escovedo, Darcy ; Haas, AJ
Abstract :
A technique to optimize power determines the minimum operating voltage during manufacturing testing on a per die basis. The die is then programmed to operate at the minimum voltage for the life of the die. Silicon results to evaluate the effectiveness of a variety of techniques to determine the minimum voltage of a die, in a manufacturing environment, are presented. Based on this we propose an adaptive hybrid test flow that is guaranteed to compute the minimum voltage while minimizing test time. Finally, sample data on power optimization achievable using power reduction is provided.
Keywords :
circuit optimisation; elemental semiconductors; integrated circuit manufacture; integrated circuit testing; silicon; Si; adaptive hybrid test flow; manufacturing testing; minimum operating voltage; optimal manufacturing flow; power optimization; power reduction; Data models; Manufacturing; Mathematical model; Monitoring; Ring oscillators; Transistors; Voltage measurement;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139169
