DocumentCode :
3152127
Title :
Effects of selective wet etching on the spectral properties of a vertical-cavity surface-emitting laser/detector
Author :
Bringer, C. ; Bardinal, V. ; Camps, T. ; Dubreuil, P. ; Fontaine, C.
Author_Institution :
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
133
Abstract :
In this paper, we present results on modelling, fabrication and characterization of oxide-confined VCSELs for short-distance alternative emission and photodetection at 820 nm. In the present designed single-cavity GaAs-based device, the buried oxide layer is not only used to obtain a single mode laser beam but also to enable decoupling between a small surface emission, limited by the aperture and a large surface detection, limited by the internal diameter of the top electrodes. The selective wet etching was found to improve simultaneously the detection sensitivity and the differential quantum efficiency without damaging the active surface.
Keywords :
III-V semiconductors; buried layers; etching; gallium arsenide; infrared spectra; laser cavity resonators; laser modes; optical fabrication; photodetectors; surface emitting lasers; 820 nm; GaAs; buried oxide layer; detection sensitivity; differential quantum efficiency; oxide-confined VCSEL; selective wet etching; short-distance emission; short-distance photodetection; single mode laser beam; single-cavity GaAs device; spectral property; vertical-cavity surface-emitting detector; vertical-cavity surface-emitting laser; Electronic mail; Laser beams; Laser modes; Mirrors; Optical surface waves; Optoelectronic devices; Resonance; Surface emitting lasers; Vertical cavity surface emitting lasers; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
Type :
conf
DOI :
10.1109/CLEOE.2003.1312194
Filename :
1312194
Link To Document :
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