Title :
Deterministic IDDQ diagnosis using a net activation based model
Author :
Kun, András ; Arnold, Ralf ; Heinrich, Peter ; Maugard, Guenole ; Tang, Huaxing ; Cheng, Wu-Tung
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
Abstract :
In Automotive business, the quiescent supply current test (IDDQ) is a widely used and valuable test method to screen out production failures and reach the required low defective parts per million (DPPM) quality targets. Automatic Test Pattern Generation (ATPG) tools can generate scan based IDDQ patterns with high test coverage for Pseudo Stuck-At (PSA) faults. Functional pass but IDDQ failing devices need to be diagnosed for various purposes. In this paper a fast simulation based method is proposed to diagnose IDDQ failures with single or multiple defects for digital circuitry. The results are verified on real silicon for several 130nm Automotive designs. Furthermore automation of the diagnosis method for high volume diagnosis similar to scan volume diagnosis is shown in the paper outlook.
Keywords :
automatic test pattern generation; elemental semiconductors; fault diagnosis; integrated circuit modelling; integrated circuit testing; logic testing; silicon; ATPG; Si; automatic test pattern generation; automotive business; automotive designs; defective parts per million quality targets; diagnosis method automation; digital circuitry; high volume diagnosis; net activation based model; production failures; pseudo stuck-at faults; quiescent supply current test; scan volume diagnosis; size 130 nm; Automotive engineering; CMOS integrated circuits; Circuit faults; Clustering algorithms; Current measurement; Leakage current; Silicon;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139175
