Deterministic IDDQ diagnosis using a net activation based model

Author

Kun, András ; Arnold, Ralf ; Heinrich, Peter ; Maugard, Guenole ; Tang, Huaxing ; Cheng, Wu-Tung

Author_Institution

Infineon Technol. AG, Neubiberg, Germany

fYear

2011

fDate

20-22 Sept. 2011

Firstpage

1

Lastpage

10

Abstract

In Automotive business, the quiescent supply current test (IDDQ) is a widely used and valuable test method to screen out production failures and reach the required low defective parts per million (DPPM) quality targets. Automatic Test Pattern Generation (ATPG) tools can generate scan based IDDQ patterns with high test coverage for Pseudo Stuck-At (PSA) faults. Functional pass but IDDQ failing devices need to be diagnosed for various purposes. In this paper a fast simulation based method is proposed to diagnose IDDQ failures with single or multiple defects for digital circuitry. The results are verified on real silicon for several 130nm Automotive designs. Furthermore automation of the diagnosis method for high volume diagnosis similar to scan volume diagnosis is shown in the paper outlook.

Keywords

automatic test pattern generation; elemental semiconductors; fault diagnosis; integrated circuit modelling; integrated circuit testing; logic testing; silicon; ATPG; Si; automatic test pattern generation; automotive business; automotive designs; defective parts per million quality targets; diagnosis method automation; digital circuitry; high volume diagnosis; net activation based model; production failures; pseudo stuck-at faults; quiescent supply current test; scan volume diagnosis; size 130 nm; Automotive engineering; CMOS integrated circuits; Circuit faults; Clustering algorithms; Current measurement; Leakage current; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference (ITC), 2011 IEEE International

Conference_Location

Anaheim, CA

ISSN

1089-3539

Print_ISBN

978-1-4577-0153-5

Type

conf

DOI

10.1109/TEST.2011.6139175

Filename

6139175