Title :
A novel robust and accurate spectral testing method for non-coherent sampling
Author :
Sudani, Siva ; Wu, Minshun ; Chen, Degang
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
Spectral testing is one of the frequently encountered problems in signal processing and communications. It is a challenging task to obtain coherent sampling for accurate spectral testing. Windowing techniques are widely used to perform spectral testing when the sampling is slightly noncoherent. This paper proposes a new Fundamental Identification and Replacement (FIR) method. The proposed method can estimate the spectral characteristics accurately without requiring coherent sampling. The method is robust to any level of non-coherency, which makes on-chip spectral testing possible. The new method is computationally efficient and is applicable for high resolution spectral testing. Furthermore, the proposed method can perform both single tone signal test and multiple tone signal test accurately. The method gives accurate results even in situations when the windowing techniques cannot give correct results. Simulation results show the robustness and the computational efficiency of the proposed method. The method is also validated with the experimental data.
Keywords :
frequency estimation; integrated circuit testing; signal sampling; spectral analysis; fundamental identification and replacement method; multiple tone signal test; noncoherent sampling; on chip spectral testing; signal processing; single tone signal test; spectral characteristic estimation; spectral testing method; Clocks; Discrete Fourier transforms; Estimation; Harmonic analysis; Power system harmonics; System-on-a-chip; Testing;
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-0153-5
DOI :
10.1109/TEST.2011.6139176