DocumentCode :
3152225
Title :
Temporally resolved impedance measurement of differential, RF-powered devices using the example of a μwave RFID front-end
Author :
Bansleben, Christian ; Kuhn, Silvio ; Gay, Nicolas ; Fischer, Wolf-Joachim
Author_Institution :
Fraunhofer Inst. for Photonic Microsyst. (IPMS), Dresden, Germany
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
852
Lastpage :
855
Abstract :
This work was motivated by the idea to monitor the input impedance of differential front-ends of passive RFID-transponders depending on their power-consumption. Different methods readily available in state-of-the-art network analyzers are compared with regard to the special demands imposed by passive RFID front-ends. At this the correct stimulation of the DUT appears to be the major issue of conventional methods. Hereupon a new approach is proposed which for the first time combines the proper stimulation of differential, RF-powered devices with the data aquisition of differential mixed-mode S-parameters in temporal resolution. The new measurement method is applied to a 2.45 GHz RFID transponder showing detailed mixed-mode results of its power-up behavior.
Keywords :
data acquisition; electric impedance measurement; network analysers; radiofrequency identification; transponders; μwave RFID front-end; data acquisition; differential RF-powered devices; differential mixed-mode S-parameters; frequency 2.45 GHz; network analyzers; passive RFID-transponders; power-consumption; temporally resolved impedance measurement; Impedance measurement; Integrated circuit measurements; Microwave measurements; Passive RFID tags; Radio frequency; Radiofrequency identification; Rectifiers; Scattering parameters; Signal resolution; Transponders; Scattering parameters measurement; differential analyzers; integrated circuit testing; microwave measurement; multiport circuits; network testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5518044
Filename :
5518044
Link To Document :
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