DocumentCode :
3152377
Title :
[Back cover]
fYear :
2011
fDate :
20-22 Sept. 2011
Abstract :
Presents the back cover of the proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2011 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4577-0153-5
Type :
conf
DOI :
10.1109/TEST.2011.6139183
Filename :
6139183
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3152377
