• DocumentCode
    3152612
  • Title

    An RF-MEMS switch with mN contact forces

  • Author

    Patel, C.D. ; Rebeiz, Gabriel M.

  • Author_Institution
    University of California San Diego, La Jolla, United States
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper presents a new RF MEMS switch design which is capable of generating large forces under electrostatic actuation. The switch is 155×130 um^2, and results in 0.8–1.8 mN of contact force at 80–100 V, with a release force of 0.75 mN. The design is also highly insensitive to biaxial stress and to stress gradients. A prototype switch, fabricated on a high resistivity silicon substrates using an 8 um-thick gold cantilever, results in pull-in voltage of 62 V, a switching time of 6 us, and an upstate capacitance of 24 fF. The contact metal is Au-Ru and the measured switch resistance dropped from 250 to 1.2 ohms for Vact = 60 – 100 V, showing the large contact-force operation of the switch. Measurements versus temperature show excellent stability from 25 – 105 C.
  • Keywords
    Conductivity; Contacts; Electrical resistance measurement; Electrostatic actuators; Prototypes; Radiofrequency microelectromechanical systems; Silicon; Stress; Switches; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5518064
  • Filename
    5518064