DocumentCode
3152926
Title
The influence of defects on the emission spectra of high power laser diodes
Author
Bream, P.J. ; Bull, S. ; Xia, R. ; Andrianov, A.Y. ; Harrison, I. ; Larkins, E.C.
Author_Institution
Sch. of Electr. & Electron. Eng., Nottingham Univ., UK
fYear
2003
fDate
22-27 June 2003
Firstpage
177
Abstract
This paper gives the electroluminescence (EL) spectra analysis of high power laser bars (diodes) by simple semianalytic models in addition to the fast Fourier transform to simulate laser cavities with multiple defects. These models, based on plane-wave propagation and normal incidence boundary conditions, allow the defect positions to be determined and the estimation of their reflectivities and losses.
Keywords
electroluminescence; fast Fourier transforms; laser cavity resonators; optical losses; reflectivity; semiconductor lasers; spectral analysis; EL spectra analysis; electroluminescence; emission spectra; fast Fourier transform; high power laser diode; incidence boundary condition; laser cavity; losses; multiple defect; plane-wave propagation; reflectivity; semianalytic model; Analytical models; Bars; Boundary conditions; Diode lasers; Electroluminescence; Fast Fourier transforms; Laser modes; Optical propagation; Power lasers; Reflectivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN
0-7803-7734-6
Type
conf
DOI
10.1109/CLEOE.2003.1312238
Filename
1312238
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