DocumentCode
3153156
Title
Misuse of XmR quality control charts for common single parameter probability distributions
Author
Benneyan, James
Author_Institution
Quality & Productivity Lab., Northeastern Univ., Boston, MA, USA
fYear
2009
fDate
6-9 July 2009
Firstpage
1291
Lastpage
1296
Abstract
Individuals XmR control charts based on the normality assumption and a moving range estimate for a sigma typically are used if data occur infrequently or rational subgroups are not obvious. Although often are advised as a simple robust omnibus chart for any (non-normal) data, this practice is not always advisable, especially for common single parameter distributions for which exact and equally simple methods exist or for ldquophase 1rdquo start-up data of unknown stability. We investigate performance consequences when these charts are applied erroneously to binomial, Poisson, geometric, or exponential processes, using either 3-sigma or probability limits, often resulting in significantly compromised average run lengths due to over-fitting of both natural and unnatural variation via an in-fact non-existent second parameter (sigma).
Keywords
Poisson distribution; control charts; exponential distribution; statistical process control; stochastic processes; 3-sigma; Poisson process; XmR quality control chart; average run length; binomial process; exponential process; geometric process; natural variation; nonexistent second parameter; normality assumption; probability limit; single parameter probability distribution; statistical process control chart; unnatural variation; Control charts; Manufacturing industries; Monitoring; Parameter estimation; Probability distribution; Process control; Productivity; Quality control; Robust stability; State estimation; Moving range; SPC; attribute control charts; rare events; statistical process control;
fLanguage
English
Publisher
ieee
Conference_Titel
Computers & Industrial Engineering, 2009. CIE 2009. International Conference on
Conference_Location
Troyes
Print_ISBN
978-1-4244-4135-8
Electronic_ISBN
978-1-4244-4136-5
Type
conf
DOI
10.1109/ICCIE.2009.5223767
Filename
5223767
Link To Document