Title :
Measurement of the Wigner distribution of a tapered semiconductor laser
Author :
Neubert, B. ; Scharfe, W.-D. ; Huber, G.
Author_Institution :
Rofin-Sinar Laser GmbH, Hamburg, Germany
Abstract :
The aim of the paper is to characterize these lasers by measuring it´s Wigner distribution and thus obtaining phase and coherence information. Tapered semiconductor lasers exceed ordinary semiconductor lasers in brightness due to an improved lateral structure. Moving slit technology is used to obtain one dimensional intensity distributions of an external caustic of the laser beam. The blurring of the distribution away from the center can be attributed to beam aberrations.
Keywords :
Wigner distribution; aberrations; brightness; laser beams; light coherence; semiconductor lasers; Wigner distribution; beam aberration; blurring; brightness; coherence information; laser beam; moving slit technology; one dimensional intensity distribution; phase information; tapered semiconductor laser; Attenuation measurement; Brightness; Cameras; Collimators; Coordinate measuring machines; Laser beams; Optical attenuators; Optical propagation; Phase measurement; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
DOI :
10.1109/CLEOE.2003.1312251
